FISCHIONE INSTRUMENTS MODEL 1010 LAMP Ion Mill

A compact, tabletop precision ion mill/polishing system. Used for final polishing of a specimen before it is placed in the TEM.

The 3 mm specimen produced by the dimpling dimple grinding technique or by diamond lapping polishing is mounted between in the TEM grid low angle specimen plates held within a dedicated specimen gear and introduced in to the sample specimen chamber of the ion mill.

T he Model 1010 LAMP Ion Mill is fully programmable.

The ion Ion milling is the final polishing thinning and /or cleaning up of a specimen from prior following mechanical grinding and polishing before going into the and prior to TEM for analysis Argon gas is used. Bombarding a specimen surface with energet ic argon ions results in material removal without introducing subsurface damage or artifacts.