The 3 mm specimen produced by the dimpling dimple grinding technique or by diamond lapping polishing is mounted between in the TEM grid low angle specimen plates held within a dedicated specimen gear and introduced in to the sample specimen chamber of the ion mill.

The Model 1010 LAMP Ion Mill is fully programmable.

The ion Ion milling is the final polishing thinning and /or cleaning up of a specimen from prior following mechanical grinding and polishing before going into the and prior to TEM for analysis Argon gas is used. Bombarding a specimen surface with energet ic argon ions results in material removal without introducing subsurface damage or artifacts.