Facilities > Sample Prep

Sample Prep These equipments are used to prepare very thin and electron transparency samples for SEM/TEM/SIMS or other surface science technique characterization. Both plan view and cross sectional samples can be produced. The available instruments are: Buehler Isomet™ low speed diamond saw Buhler Ecomet™ grinder/polisher Fischione Model 170 ultrasonic disk cutter Fischione Model 160 specimen grinder Fischione Model 150 Dimpling Grinder Fischione Model 180 cross section TEM preparation kit Fischione Model 1010 low angle milling system.