The transmission electron microscopes (TEM) available at University of Kentucky are the facilities for characterizing the crystallinity, defects, composition of the materials on micro-scale and nano-scale. The JEOL 2000 is capable of imaging, diffraction, EDS and STEM. The JEOL 2010 HRTEM has a field emission electron source and a resolution of 0.2nm. It is also equipped with CCD camera for digital imaging and EELS for composition analysis.