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Advanced Materials Synthesis
Nanomaterials Characterization
Sample Prep
SEM
TEM
XRD
Raman
FTIR
TGA/DSC
AFM/STM
Surface Science Facility
3-D Nano Lithography
Sample Prep
These equipments are used to prepare very thin and electron transparency samples for SEM/TEM/SIMS or other surface science technique characterization. Both plan view and cross sectional samples can be produced. The available instruments are:
Buehler Isomet™ low speed diamond saw
Buhler Ecomet™ grinder/polisher
Fischione Model 170 ultrasonic disk cutter
Fischione Model 160 specimen grinder
Fischione Model 150 Dimpling Grinder
Fischione Model 180 cross section TEM preparation kit
Fischione Model 1010 low angle milling system.